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Journal of Bacteriology, October 1998, p. 5260-5262, Vol. 180, No. 19
Department of Immunology and Microbiology,
Wayne State University School of Medicine, Detroit, Michigan 48201
Received 26 May 1998/Accepted 3 August 1998
We report a new role for H-NS in Shigella spp.:
suppression of repair of DNA damage after UV irradiation. H-NS-mediated
suppression of virulence gene expression is thermoregulated in
Shigella, being functional at 30°C and nonfunctional at
37 to 40°C. We find that H-NS-mediated suppression of DNA repair
after UV irradiation is also thermoregulated. Thus, Shigella
flexneri M90T, incubated at 37 or 40°C postirradiation, shows
up to 30-fold higher survival than when incubated at 30°C
postirradiation. The hns mutants BS189 and BS208, both of
which lack functional H-NS, show a high rate of survival (no
repression) whether incubated at 30 or 40°C postirradiation. Suppression of DNA repair by H-NS is not mediated through genes on the
invasion plasmid of S. flexneri M90T, since BS176, cured of
plasmid, behaves identically to the parental M90T. Thus, in Shigella the nonfunctionality of H-NS permits enhanced DNA
repair at temperatures encountered in the human host. However,
pathogenic Escherichia coli strains (enteroinvasive and
enterohemorrhagic E. coli) show low survival whether
incubated at 30 or 40°C postirradiation. E. coli K-12
shows markedly different behavior; high survival postirradiation at
both 30 and 40°C. These K-12 strains were originally selected from
E. coli organisms subjected to both UV and X irradiation. Therefore, our data suggest that repair processes, extensively described for laboratory strains of E. coli, require
experimental verification in pathogenic strains which were not adapted
to irradiation.
0021-9193/98/$04.00+0
Copyright © 1998, American Society for Microbiology. All rights reserved.
H-NS Regulates DNA Repair in
Shigella
*
Corresponding author. Mailing address: Dept. of
Immunology and Microbiology, Wayne State Medical School, 540 E. Canfield, Detroit, MI 48201. Phone: (313) 577-1313. Fax: (313)
577-1155. E-mail: spalchau{at}med.wayne.edu.
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